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» Hybrid Multichannel Architecture for Embedded Test Compression to Process Rejected Test Patterns




Author:

Sebastian Huhn, Daniel Tille, Rolf Drechsler
Conference:
IEEE European Test Symposium (ETS)
Reference:

Baden Baden, Germany, 2019
Hyperlink:

[Link to the Conference]



» Machine Learning-based Prediction of Test Power




Author:

Harshad Dhotre, Stephan Eggersglüß, Krishnendu Chakrabarty, Rolf Drechsler
Conference:
IEEE European Test Symposium (ETS)
Reference:

Baden Baden, Germany, 2019
Hyperlink:

[Link to the Conference]



» Early Concolic Testing of Embedded Binaries with Virtual Prototypes: A RISC-V Case Study




Author:

Vladimir Herdt, Daniel Große, Hoang M. Le, Rolf Drechsler
Conference:
Design Automation Conference (DAC)
Reference:

Las Vegas, USA, 2019
Hyperlink:

[Link to the Conference]



» Using Reverse Engineering to Bring Light into Backward Rewriting for Big and Dirty Multipliers




Author:

Alireza Mahzoon, Daniel Große, Rolf Drechsler
Conference:
Design Automation Conference (DAC)
Reference:

Las Vegas, USA, 2019
Hyperlink:

[Link to the Conference]



» Temporal Tracing of On-Chip Signals using Timeprints




Author:

Rehab Massoud, Hoang M. Le, Peter Chini, Prakash Saivasan, Roland Meyer and Rolf Drechsler
Conference:
Design Automation Conference (DAC)
Reference:

Las Vegas, USA, 2019
Hyperlink:

[Link to the Conference]



» HotAging - Impact of Power Dissipation on Hardware Degradation




Author:

Frank Sill Torres, Alberto Garcia Ortiz and Rolf Drechsler
Conference:
IEEE International Symposium on Circuits and Systems (ISCAS)
Reference:

Sapporo, Japan, 2019.
Hyperlink:

[Link to the Conference]



» (ReCo)Fuse Your PRC or Lose Security: Finally Reliable Reconfiguration-based Countermeasures on FPGAs




Author:

Kenneth Schmitz, Buse Ustaoglu, Daniel Große, Rolf Drechsler
Conference:
International Symposium on Applied Reconfigurable Computing (ARC)
Reference:

Darmstadt, Germany, 2019
Hyperlink:

[Link to the Conference]
PDF:

[click here]



» Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements




Author:

Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler
Conference:
20th IEEE Latin American Test Symposium (LATS)
Reference:

Santiago, Chile, 2019
Hyperlink:

[Link to the Conference]



» Look What I Can Do: Acquisition of Programming Skills in the Context of Living Labs




Author:

Mazyar Seraj, Cornelia Große, Serge Autexier, Rolf Drechsler
Conference:
41st ACM/IEEE International Conference on Software Engineering (ICSE’19)
Reference:

Montréal, QC, Canada, 2019
Hyperlink:

[Link to the Conference]



» Impact of NBTI on Increasing the Susceptibility of FinFET to Radiation




Author:

Frank Sill Torres, Hussam Amrouch, Jörg Henkel and Rolf Drechsler
Conference:
IEEE International Reliability Physics Symposium (IRPS 2019)
Reference:

Monterey, California, USA, March 31 - April 4, 2019
Hyperlink:

[Link to the Conference]



» Detection of Hardware Trojans in SystemC HLS Designs via Coverage-guided Fuzzing




Author:

Hoang M. Le, Daniel Große, Niklas Bruns, Rolf Drechsler
Conference:
Design, Automation and Test in Europe (DATE)
Reference:

Florence, Italy, 2019
Hyperlink:

[Link to the Conference]
PDF:

[click here]



» Better Late Than Never: Verification of Embedded Systems After Deployment




Author:

Martin Ring, Fritjof Bornebusch, Christoph Lüth, Robert Wille, Rolf Drechsler
Conference:
Design, Automation and Test in Europe (DATE)
Reference:

Florence, Italy, 2019
Hyperlink:

[Link to the Conference]
PDF:

[click here]



» Data Flow Testing for SystemC-AMS Timed Data Flow Models




Author:

Muhammad Hassan, Daniel Große, Hoang M. Le, Rolf Drechsler
Conference:
Design, Automation and Test in Europe (DATE)
Reference:

Florence, Italy, 2019
Hyperlink:

[Link to the Conference]
PDF:

[click here]



» Verifying Instruction Set Simulators using Coverage-guided Fuzzing




Author:

Vladimir Herdt, Daniel Große, Hoang M. Le, Rolf Drechsler
Conference:
Design, Automation and Test in Europe (DATE)
Reference:

Florence, Italy, 2019
Hyperlink:

[Link to the Conference]
PDF:

[click here]



» One Method - All Error-Metrics: A Three-Stage Approach for Error-Metric Evaluation in Approximate Computing




Author:

Saman Froehlich, Daniel Große, Rolf Drechsler
Conference:
Design, Automation and Test in Europe (DATE)
Reference:

Florence, Italy, 2019
Hyperlink:

[Link to the Conference]
PDF:

[click here]



» Accuracy and Compactness in Decision Diagrams for Quantum Computation




Author:

Alwin Zulehner, Philipp Niemann, Rolf Drechsler, Robert Wille
Conference:
Design, Automation and Test in Europe (DATE)
Reference:

Florence, Italy, 2019
Hyperlink:

[Link to the Conference]
PDF:

[click here]



» Scalable Design for Field-coupled Nanocomputing Circuits




Author:

Marcel Walter, Robert Wille, Frank Sill Torres, Daniel Große, Rolf Drechsler
Conference:
24th Asia and South Pacific Design Automation Conference (ASP-DAC)
Reference:

Tokyo, Japan, 2019
Hyperlink:

[Link to the Conference]
PDF:

[click here]



» Maximizing Power State Cross Coverage in Firmware-based Power Management




Author:

Vladimir Herdt, Hoang M. Le, Daniel Große, Rolf Drechsler
Conference:
24th Asia and South Pacific Design Automation Conference (ASP-DAC)
Reference:

Tokyo, Japan, 2019
Hyperlink:

[Link to the Conference]
PDF:

[click here]



» Power Intent from Initial ESL Prototypes: Extracting Power Management Parameters




Author:

David Lemma, Mehran Goli, Daniel Große, Rolf Drechsler
Conference:
IEEE Nordic Circuits and Systems Conference (NORCAS)
Reference:

Tallinn, Estonia, 2018
Hyperlink:

[Link to the Conference]
PDF:

[click here]



» Cell Library Design for Ultra-Low Power Internet-of-Things Applications




Author:

Michael Lopes Oliveira, Keyliane Fernandes, Frank Sill Torres
Conference:
3rd International Symposium on Instrumentation Systems, Circuits and Transducers (INSCIT 2018)
Reference:

Bento Gonçalves, Brazil, 2018
Hyperlink:

[Link to the Conference]
PDF:

[click here]




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