NANOTEST

The project is concerned with the development of new methods for the test generation of digital circuits in low-Nanometer process.

Contact: Rolf Drechsler, Stephan Eggersglüß

The project is concerned with the development of new methods for the test generation of digital circuits.

Many challenges exist especially for new chip generations manufactured in small nanometer processes. In order to cope with these challenges, a cost-effective and robust test environment will be developed based on formal methods.
Oct. 2013 – Sept. 2017

Corresponding person: Dr. Stephan Eggersgluess

Funded by the Institutional Strategy of the University of Bremen (M8-Post-Doc Initiative), funded by the German Excellence Initiative.