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CONFERENCES



» Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements




Author:

Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler
Conference:
20th IEEE Latin American Test Symposium (LATS)
Reference:

Santiago, Chile, 2019
Hyperlink:

[To the Site of this Conference]



» Constraint-based Pattern Retargeting for Reducing Localized Power Activity during Testing




Author:

Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler, Mehdi Dehbashi, Ulrike Pfannkuchen
Conference:
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Reference:

Budapest, Hungary, 2018
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Identification of Efficient Clustering Techniques for Test Power Activity on the Layout




Author:

Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler
Conference:
26th IEEE Asian Test Symposium (ATS)
Reference:

Taipei, Taiwan, 2017
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas




Author:

Harshad Dhotre, Stephan Eggersglüß, Mehdi Dehbashi, Ulrike Pfannkuchen, Rolf Drechsler
Conference:
30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Reference:

Cambridge, UK, 2017
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]


WORKSHOPS




» IR-drop Prediction of Test Patterns Using Parasitic Elements




Author:

Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler
Workshop:
31. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2019)
Reference:

Prien am Chiemsee, Germany, 2019
Hyperlink:

[Link to the Workshop]



» ATPG Constraint Analysis for Reducing Regional Power Activity




Author:

Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler, Mehdi Dehbashi, Ulrike Pfannkuchen
Workshop:
30. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2018)
Reference:

Freiburg (Breisgau), Germany, 2018
Hyperlink:

[Link to the Workshop]



» A Lightweight Method for Transient Test Power Pattern Analysis for Pattern Selection




Author:

Harshad Dhotre, Stephan Eggersglüß
Workshop:
29. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2017)
Reference:

Lübeck, Germany, 2017
Hyperlink:

[Link to the Workshop]

















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