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BOOKS


BOOK CONTRIBUTIONS


JOURNALS


CONFERENCES



» Identification of Efficient Clustering Techniques for Test Power Activity on the Layout




Author:

Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler
Conference:
26th IEEE Asian Test Symposium (ATS)
Reference:

Taipei, Taiwan, 2017
Hyperlink:

[To the Site of this Conference]



» Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas




Author:

Harshad Dhotre, Stephan Eggersglüß, Mehdi Dehbashi, Ulrike Pfannkuchen, Rolf Drechsler
Conference:
30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Reference:

Cambridge, UK, 2017
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]


WORKSHOPS




» A Lightweight Method for Transient Test Power Pattern Analysis for Pattern Selection




Author:

Harshad Dhotre, Stephan Eggersglüß
Workshop:
29. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2017)
Reference:

Lübeck, Germany, 2017
Hyperlink:

[Link to the Workshop]

















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