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CONFERENCES



» Fault Ordering for Automatic Test Pattern Generation of Reversible Circuits




Author:

Robert Wille, Hongyan Zhang, Rolf Drechsler
Conference:
43rd International Symposium on Multiple-Valued Logic (ISMVL)
Reference:

pp. 29-34, Toyama, 2013
Hyperlink:

[To the Site of this Conference]
PDF:

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» Improved Fault Diagnosis for Reversible Circuits




Author:

Hongyan Zhang, Robert Wille, Rolf Drechsler
Conference:
Asian Test Symposium (ATS)
Reference:

New Delhi, 2011
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Determining Minimal Testsets for Reversible Circuits Using Boolean Satisfiability




Author:

Hongyan Zhang, Stefan Frehse, Robert Wille, Rolf Drechsler
Conference:
10th IEEE Africon
Reference:

Livingstone, 2011
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» ATPG for Reversible Circuits Using Simulation, Boolean Satisfiability, and Pseudo Boolean Optimization




Author:

Robert Wille, Hongyan Zhang, Rolf Drechsler
Conference:
IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
Reference:

pp. 120-125, Chennai, 2011
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]


WORKSHOPS




» SAT-based ATPG for Reversible Circuits




Author:

Hongyan Zhang, Robert Wille, Rolf Drechsler
Workshop:
5th International Design & Test Workshop (IDT)
Reference:

pp. 149-154, Abu Dhabi, 2010
Hyperlink:

[Link to the Workshop]

















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