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BOOKS


BOOK CONTRIBUTIONS


JOURNALS

» Debugging hardware designs using dynamic dependency graphs
[Link to the Homepage of this journal]




Author:

Jan Malburg, Alexander Finder, Görschwin Fey
Journal:
Microprocessors and Microsystems (MICPRO)
Details:
accepted, DOI: 10.1016/j.micpro.2016.10.004 Link
Year:


2016





» A Simulation Based Approach for Automated Feature Localization
[Link to the Homepage of this journal]




Author:

Jan Malburg, Alexander Finder, Görschwin Fey
Journal:
IEEE Trans. on CAD of Integrated Circuits and Systems
Details:
Volume:33, Issue: 12, Pages 1886-1899 DOI: 10.1109/TCAD.2014.2360462 Link
Year:


2014





» Search-based testing using constraint-based mutation
[Link to the Homepage of this journal]




Author:

Jan Malburg, Gordon Fraser
Journal:
Software Testing, Verification and Reliability
Details:
Volume 24, Issue 6, pages 472–495, September 2014, DOI: 10.1002/stvr.1508 Link
Year:


2013 (online)






CONFERENCES



» Towards Making Fault Injection on Abstract Models a More Accurate Tool for Predicting RT-Level Effects




Author:

Tino Flenker, Jan Malburg, Goerschwin Fey, Serhiy Avramenko, Massimo Violante and Matteo Sonza Reorda
Conference:
IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
Reference:

Bochum, Germany, 2017
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Property mining using dynamic dependency graphs




Author:

Jan Malburg, Tino Flenker, Goerschwin Fey
Conference:
22nd Asia and South Pacific Design Automation Conference (ASP-DAC)
Reference:

Chiba/Tokyo, Japan, 2017
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Designing Reliable Cyber-Physical Systems




Author:

Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon Ter Braak, Sergei Devadze, Görschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard Rauwerda, Heinz Riener, Franz Röck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao
Conference:
Forum on specification & Design Languages (FDL)
Reference:

Bremen, Germany, 2016
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Automatically Connecting Hardware Blocks via Light-Weight Matching Techniques




Author:

Jan Malburg Niklas Krafczyk Görschwin Fey
Conference:
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Reference:

pp. 21-26, Warschau, Polen, 2014
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Analyse dynamischer Abhängigkeitsgraphen zum Debugging von Hardwaredesigns




Author:

Jan Malburg Alexander Finder Görschwin Fey
Conference:
7. ITG/GMM/GI-Fachtagung Zuverlässigkeit und Entwurf (ZuE2013)
Reference:

pp. 59-66, Dresden, Germany, 2013
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Tuning Dynamic Data Flow Analysis to Support Design Understanding




Author:

Jan Malburg, Alexander Finder, Görschwin Fey
Conference:
Design, Automation and Test in Europe (DATE'13)
Reference:

pp. 1179-1184, Grenoble, France, 2013
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Automated Feature Localization for Hardware Designs using Coverage Metrics




Author:

Jan Malburg, Alexander Finder, Görschwin Fey
Conference:
Design Automation Conference (DAC)
Reference:

pp. 941-946, San Francisco, 2012
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]


WORKSHOPS




» Mining Latency Guarantees for RT-level Designs




Author:

Jan Malburg, Heinz Riener, Görschwin Fey
Workshop:
4th Workshop on Design Automation for Understanding Hardware Designs (DUHDe)
Reference:

Lausanne, Switzerland, 2017
Hyperlink:

[Link to the Workshop]



» Generating good properties from a small number of use cases




Author:

Jan Malburg, Tino Flenker, Görschwin Fey
Workshop:
International Verification and Security Workshop (IVSW'16)
Reference:

Sant Feliu de Guixols, Catalunya, Spain, 2016
Hyperlink:

[Link to the Workshop]



» Towards analysing feature locations through testing traces with BUT4Reuse




Author:

Jabier Martinez, Jan Malburg, Tewfik Ziadi, Görschwin Fey
Workshop:
DATE Friday Workshop: Design Automation for Understanding Hardware Designs (DUHDe)
Reference:

Grenoble, France, 2015
Hyperlink:

[Link to the Workshop]



» Mutation based Feature Localization




Author:

Jan Malburg, Emmanuelle Encrenaz-Tiphene, Görschwin Fey
Workshop:
15th International Workshop on Microprocessor Test and Verification
Reference:

Austin, USA, 2014
PDF:

[view Pdf]
Hyperlink:

[Link to the Workshop]



» Automatically Connecting Hardware Blocks via Light-Weight Matching Techniques (Extended Abstract)




Author:

Jan Malburg, Niklas Krafczyk, Görschwin Fey
Workshop:
DATE Friday Workshop: Design Automation for Understanding Hardware Designs
Reference:

page 30, Dresden, Germany, 2014
PDF:

[view Pdf]
Hyperlink:

[Link to the Workshop]



» Mutation based Feature Localization




Author:

Jan Malburg, Emmanuelle Encrenaz-Tiphene, Görschwin Fey
Workshop:
DATE Friday Workshop: Design Automation for Understanding Hardware Designs
Reference:

pp. 55-60, Dresden, Germany, 2014
Hyperlink:

[Link to the Workshop]



» Automated Feature Localization for Hardware Designs using Coverage Metrics




Author:

Jan Malburg, Alexander Finder, Görschwin Fey
Workshop:
15. Workshop Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV)
Reference:

pp. 85-96, Kaiserslautern, Germany, 2012
PDF:

[view Pdf]
Hyperlink:

[Link to the Workshop]

















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