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BOOKS


BOOK CONTRIBUTIONS


JOURNALS

» On Optimization-based ATPG and its Application for Highly Compacted Test Sets
[Link to the Homepage of this journal]




Author:

Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler
Journal:
IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems
Details:
Vol. 35(12), pp. 2104-2117
Year:


2016






CONFERENCES



» Trust is good, Control is better: Hardware-based Instruction-Replacement for Reliable Processor-IPs




Author:

Kenneth Schmitz, Arun Chandrasekharan, Jonas Gomes Filho, Daniel Große, Rolf Drechsler
Conference:
22nd Asia and South Pacific Design Automation Conference (ASP-DAC)
Reference:

Chiba/Tokyo, Japan, 2017
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Ensuring Safety and Reliability of IP-based System Design – A Container Approach




Author:

Arun Chandrasekharan, Kenneth Schmitz, Ulrich Kühne, Rolf Drechsler
Conference:
IEEE International Symposium on Rapid System Protoyping (RSP), 2015
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Optimization-based Multiple Target Test Generation for Highly Compacted Test Sets




Author:

Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler
Conference:
19th IEEE European Test Symposium (ETS)
Reference:

Paderborn, Germany, 2014
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]


WORKSHOPS




» Verilog2GEXF - Dynamic Large Scale Circuit Visualization




Author:

Kenneth Schmitz, Jannis Stoppe, Rolf Drechsler
Workshop:
4th Workshop on Design Automation for Understanding Hardware Designs (DUHDe)
Reference:

Lausanne, Switzerland, 2017
Hyperlink:

[Link to the Workshop]



» Using Lightweight Containers in Hardware/Software Co-Design for Security




Author:

Daniel Große, Kenneth Schmitz, Rolf Drechsler
Workshop:
Workshop on Computer-Aided Design and Implementation for Cryptography and Security (CADICS)
Reference:

Austin, USA, 2016
Hyperlink:

[Link to the Workshop]



» Hohe Testmengenkompaktierung durch formale Optimierungstechniken




Author:

Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler
Workshop:
Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Reference:

Bad Staffelstein, 2014
Hyperlink:

[Link to the Workshop]



» Using Optimization Techniques to Increase Test Compaction




Author:

Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler
Workshop:
IEEE 14th Workshop on RTL and High Level Testing (WRTLT'13)
Reference:

Yilan, Taiwan, 2013
Hyperlink:

[Link to the Workshop]

















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