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BOOKS

» Debug Automation from Pre-Silicon to Post-Silicon
[Read more about this book!]



Publisher:


Springer
Author:

Mehdi Dehbashi, Görschwin Fey
Format:
eBook, Hardcover
Year:


2015





BOOK CONTRIBUTIONS


JOURNALS

» Transaction-based online debug for NoC-based multiprocessor SoCs
[Link to the Homepage of this journal]




Author:

Mehdi Dehbashi, Görschwin Fey
Journal:
Microprocessors and Microsystems (MICPRO)
Details:
39(3): 157-166
Year:


2015





» Debug Automation for Logic Circuits Under Timing Variations
[Link to the Homepage of this journal]




Author:

Mehdi Dehbashi, Görschwin Fey
Journal:
IEEE Design & Test of Computers
Details:
Volume 30, Issue 6, pp. 60-69
Year:


2013





» Automated Design Debugging in a Testbench-Based Verification Environment
[Link to the Homepage of this journal]




Author:

Mehdi Dehbashi, André Sülflow, Görschwin Fey
Journal:
Embedded Hardware Design - Microprocessors and Microsystems (MICPRO)
Details:
Volume 37, Issue 2, pp. 206-217
Year:


2013






CONFERENCES



» Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas




Author:

Harshad Dhotre, Stephan Eggersglüß, Mehdi Dehbashi, Ulrike Pfannkuchen, Rolf Drechsler
Conference:
30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Reference:

Cambridge, UK, 2017
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Automated Formal Verification of X Propagation with Respect to Testability Issues




Author:

Mehdi Dehbashi, Daniel Tille, Ulrike Pfannkuchen, Stephan Eggersglüß
Conference:
IEEE International Design and Test Symposium 2014 (IDT)
Reference:

pp. 106-111, Algiers, Algerien, 2014
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» SAT-Based Speedpath Debugging Using Waveforms




Author:

Mehdi Dehbashi, Görschwin Fey
Conference:
19th IEEE European Test Symposium (ETS)
Reference:

Paderborn, Germany, 2014
Hyperlink:

[To the Site of this Conference]



» Transaction-Based Online Debug for NoC-Based Multiprocessor SoCs




Author:

Mehdi Dehbashi, Görschwin Fey
Conference:
22nd Euromicro Conference on Parallel, Distributed and Network-Based Processing (PDP)
Reference:

Turin, Italy, 2014
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Debug Automation for Synchronization Bugs at RTL




Author:

Mehdi Dehbashi, Görschwin Fey
Conference:
27th International Conference on VLSI Design
Reference:

pp. 44-49, Mumbai, India, 2014
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Efficient Automated Speedpath Debugging




Author:

Mehdi Dehbashi, Görschwin Fey
Conference:
16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Reference:

pp. 48-53, Karlovy Vary, Czech Republic, 2013
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Automated Post-Silicon Debugging of Failing Speedpaths




Author:

Mehdi Dehbashi, Görschwin Fey
Conference:
21st IEEE Asian Test Symposium (ATS)
Reference:

pp. 13-18, Niigata, Japan, 2012
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Application of Timing Variation Modeling to Speedpath Diagnosis




Author:

Mehdi Dehbashi, Görschwin Fey
Conference:
4th International Conference on System, Software, SoC and Silicon Debug (S4D)
Reference:

pp. 34-37, Vienna, Austria, 2012
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» On Modeling and Evaluation of Logic Circuits Under Timing Variations




Author:

Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan
Conference:
15th Euromicro Conference on Digital System Design (DSD)
Reference:

pp. 431-436, Izmir, Turkey, 2012
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Automated Debugging from Pre-Silicon to Post-Silicon




Author:

Mehdi Dehbashi, Görschwin Fey
Conference:
15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Reference:

pp. 324-329, Tallinn, Estonia, 2012
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Functional Analysis of Circuits Under Timing Variations




Author:

Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan
Conference:
17th IEEE European Test Symposium (ETS)
Reference:

pp. 177, Annecy, France, 2012
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Automated Post-Silicon Debugging of Design Bugs




Author:

Mehdi Dehbashi, Görschwin Fey
Conference:
3rd International Conference on System, Software, SoC and Silicon Debug (S4D)
Reference:

pp. 67-71, Munich, Germany, 2011
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Automated Design Debugging in a Testbench-Based Verification Environment




Author:

Mehdi Dehbashi, André Sülflow, Görschwin Fey
Conference:
14th Euromicro Conference on Digital System Design (DSD)
Reference:

pp. 479-486, Oulu, Finland, 2011
Best Paper Candidate
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Fault Effects in FlexRay-Based Networks with Hybrid Topology




Author:

Mehdi Dehbashi, Vahid Lari, Seyed Ghassem Miremadi, Mohammad Shokrollah-Shirazi
Conference:
3rd IEEE International Conference on Availability, Reliability and Security (ARES)
Reference:

pp. 491-496, Barcelona, Spain, 2008
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Evaluation of Babbling Idiot Failures in FlexRay-Based Networks




Author:

Vahid Lari, Mehdi Dehbashi, Seyed Ghassem Miremadi, Mojtaba Amiri
Conference:
7th IFAC International Conference on Fieldbuses and Networks in Industrial and Embedded Systems (FET)
Reference:

pp. 399-406, Toulouse, France, 2007
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Assessment of Message Missing Failures in FlexRay-Based Networks




Author:

Vahid Lari, Mehdi Dehbashi, Seyed Ghassem Miremadi, Navid Farazmand
Conference:
13th IEEE/IFIP Pacific Rim International Symposium on Dependable Computing (PRDC)
Reference:

pp. 191-194, Melbourne, Australia, 2007
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]


WORKSHOPS




» Debug Automatisierung für logische Schaltungen unter Zeitvariation mittels Waveforms




Author:

Mehdi Dehbashi, Görschwin Fey
Workshop:
26. GI/GMM/ITG Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Reference:

Bad Staffelstein, Germany, 2014
Hyperlink:

[Link to the Workshop]



» Towards Debug Automation for Timing Bugs at RTL




Author:

Mehdi Dehbashi, Görschwin Fey
Workshop:
25. GI/GMM/ITG Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Reference:

Dresden, Germany, 2013
PDF:

[view Pdf]
Hyperlink:

[Link to the Workshop]



» Functional Analysis of Circuits Under Timing Variations




Author:

Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan
Workshop:
edaWorkshop
Reference:

Hannover, Germany, 2012
PDF:

[view Pdf]
Hyperlink:

[Link to the Workshop]



» Automated Debugging from Pre-Silicon to Post-Silicon




Author:

Mehdi Dehbashi, Görschwin Fey
Workshop:
24. GI/GMM/ITG Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Reference:

Cottbus, Germany, 2012
Hyperlink:

[Link to the Workshop]

















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