» Constraint-based Pattern Retargeting for Reducing Localized Power Activity during Testing
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Author:
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Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler, Mehdi Dehbashi, Ulrike Pfannkuchen |
| Conference: |
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21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) |
Reference:
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| Budapest, Hungary, 2018
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» Machine Learning Based Test Pattern Analysis for
Localizing Critical Power Activity Areas
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Author:
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Harshad Dhotre, Stephan Eggersglüß, Mehdi Dehbashi, Ulrike Pfannkuchen, Rolf Drechsler |
| Conference: |
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30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
Reference:
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| Cambridge, UK, 2017
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Hyperlink:
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| [To the Site of this Conference]
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| [view Pdf]
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» Automated Formal Verification of X Propagation with Respect to Testability Issues
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Author:
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Mehdi Dehbashi, Daniel Tille, Ulrike Pfannkuchen, Stephan Eggersglüß |
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IEEE International Design and Test Symposium 2014 (IDT) |
Reference:
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| pp. 106-111, Algiers, Algerien, 2014
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» SAT-Based Speedpath Debugging Using Waveforms
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Author:
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Mehdi Dehbashi, Görschwin Fey |
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19th IEEE European Test Symposium (ETS) |
Reference:
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| Paderborn, Germany, 2014
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Hyperlink:
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| [To the Site of this Conference]
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» Transaction-Based Online Debug for NoC-Based
Multiprocessor SoCs
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Author:
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Mehdi Dehbashi, Görschwin Fey |
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22nd Euromicro Conference on Parallel, Distributed and Network-Based Processing (PDP) |
Reference:
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| Turin, Italy, 2014
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» Debug Automation for Synchronization Bugs at RTL
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Author:
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Mehdi Dehbashi, Görschwin Fey |
| Conference: |
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27th International Conference on VLSI Design |
Reference:
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| pp. 44-49, Mumbai, India, 2014
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» Efficient Automated Speedpath Debugging
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Author:
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Mehdi Dehbashi, Görschwin Fey |
| Conference: |
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16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) |
Reference:
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| pp. 48-53, Karlovy Vary, Czech Republic, 2013
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» Automated Post-Silicon Debugging of Failing
Speedpaths
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Author:
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Mehdi Dehbashi, Görschwin Fey |
| Conference: |
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21st IEEE Asian Test Symposium (ATS) |
Reference:
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| pp. 13-18, Niigata, Japan, 2012
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» Application of Timing Variation Modeling to Speedpath Diagnosis
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Author:
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Mehdi Dehbashi, Görschwin Fey |
| Conference: |
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4th International Conference on System, Software, SoC and Silicon Debug (S4D) |
Reference:
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| pp. 34-37, Vienna, Austria, 2012
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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» On Modeling and Evaluation of Logic Circuits
Under Timing Variations
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Author:
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Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan |
| Conference: |
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15th Euromicro Conference on Digital System Design (DSD) |
Reference:
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| pp. 431-436, Izmir, Turkey, 2012
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» Automated Debugging from Pre-Silicon to Post-Silicon
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Author:
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Mehdi Dehbashi, Görschwin Fey |
| Conference: |
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15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) |
Reference:
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| pp. 324-329, Tallinn, Estonia, 2012
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» Functional Analysis of Circuits Under Timing
Variations
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Author:
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Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan
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| Conference: |
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17th IEEE European Test Symposium (ETS) |
Reference:
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| pp. 177, Annecy, France, 2012
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» Automated Post-Silicon Debugging of Design Bugs
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Author:
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Mehdi Dehbashi, Görschwin Fey |
| Conference: |
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3rd International Conference on System, Software, SoC and Silicon Debug (S4D) |
Reference:
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| pp. 67-71, Munich, Germany, 2011
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» Automated Design Debugging in a Testbench-Based Verification Environment
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Author:
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Mehdi Dehbashi, André Sülflow, Görschwin Fey |
| Conference: |
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14th Euromicro Conference on Digital System Design (DSD) |
Reference:
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| pp. 479-486, Oulu, Finland, 2011
Best Paper Candidate
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» Fault Effects in FlexRay-Based Networks with Hybrid Topology
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Author:
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Mehdi Dehbashi, Vahid Lari, Seyed Ghassem Miremadi, Mohammad Shokrollah-Shirazi |
| Conference: |
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3rd IEEE International Conference on Availability, Reliability and Security (ARES) |
Reference:
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| pp. 491-496, Barcelona, Spain, 2008
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» Evaluation of Babbling Idiot Failures in FlexRay-Based Networks
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Author:
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Vahid Lari, Mehdi Dehbashi, Seyed Ghassem Miremadi, Mojtaba Amiri |
| Conference: |
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7th IFAC International Conference on Fieldbuses and Networks in Industrial and Embedded Systems (FET) |
Reference:
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| pp. 399-406, Toulouse, France, 2007
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» Assessment of Message Missing Failures in FlexRay-Based Networks
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Author:
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Vahid Lari, Mehdi Dehbashi, Seyed Ghassem Miremadi, Navid Farazmand |
| Conference: |
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13th IEEE/IFIP Pacific Rim International Symposium on Dependable Computing (PRDC) |
Reference:
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| pp. 191-194, Melbourne, Australia, 2007
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Hyperlink:
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| [To the Site of this Conference]
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PDF:
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| [view Pdf]
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» ATPG Constraint Analysis for Reducing Regional Power Activity
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Author:
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Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler, Mehdi Dehbashi, Ulrike Pfannkuchen |
| Workshop: |
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30. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2018) |
Reference:
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| Freiburg (Breisgau), Germany, 2018
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Hyperlink:
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| [Link to the Workshop]
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» Debug Automatisierung für logische Schaltungen unter Zeitvariation mittels Waveforms
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Author:
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Mehdi Dehbashi, Görschwin Fey |
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26. GI/GMM/ITG Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ) |
Reference:
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| Bad Staffelstein, Germany, 2014
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Hyperlink:
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| [Link to the Workshop]
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» Towards Debug Automation for Timing Bugs at RTL
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Author:
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Mehdi Dehbashi, Görschwin Fey |
| Workshop: |
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25. GI/GMM/ITG Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ) |
Reference:
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| Dresden, Germany, 2013
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PDF:
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| [view Pdf]
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Hyperlink:
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| [Link to the Workshop]
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» Functional Analysis of Circuits Under Timing
Variations
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Author:
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Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan |
| Workshop: |
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edaWorkshop |
Reference:
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| Hannover, Germany, 2012
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PDF:
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| [view Pdf]
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Hyperlink:
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| [Link to the Workshop]
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» Automated Debugging from Pre-Silicon to Post-Silicon
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Author:
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Mehdi Dehbashi, Görschwin Fey |
| Workshop: |
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24. GI/GMM/ITG Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
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Reference:
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| Cottbus, Germany, 2012
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Hyperlink:
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| [Link to the Workshop]
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