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BOOKS


BOOK CONTRIBUTIONS


JOURNALS

» Power-aware Test Scheduling Framework for IEEE 1687 Multi-Power Domain Networks using Formal Techniques
[Link to the Homepage of this journal]




Author:

Payam Habiby, Sebastian Huhn, Rolf Drechsler
Journal:
Microelectronics Reliability
Details:
accepted, pp. 1-11
Year:


2022






CONFERENCES



» Optimization-based Test Scheduling for IEEE 1687 Multi-Power Domain Networks Using Boolean Satisfiability




Author:

Payam Habiby, Sebastian Huhn, Rolf Drechsler
Conference:
28th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
Reference:

Apulia, Italy, 2021
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]



» Power-aware Test Scheduling for IEEE 1687 Networks with Multiple Power Domains




Author:

Payam Habiby, Sebastian Huhn, Rolf Drechsler
Conference:
33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Reference:

Frascati (Rome), Italy, 2020
Hyperlink:

[To the Site of this Conference]
PDF:

[view Pdf]


WORKSHOPS




» An ILP-based Global Optimum Test Scheduler for IEEE 1687 Multi-Power Domain Networks




Author:

Payam Habiby, Sebastian Huhn and Rolf Drechsler
Workshop:
34. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Reference:

Bremerhaven, Germany, 2022
PDF:

[view Pdf]
Hyperlink:

[Link to the Workshop]



» Test Scheduling Optimization Model for IEEE 1687 Multi-Power Domain Networks Using Boolean Satisfiability




Author:

Payam Habiby, Sebastian Huhn and Rolf Drechsler
Workshop:
33. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Reference:

Nordhausen, Germany, 2021
PDF:

[view Pdf]
Hyperlink:

[Link to the Workshop]

















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