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Home « Team « Publications
» Publications of
Payam Habiby
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BOOKS |
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BOOK CONTRIBUTIONS |
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JOURNALS |
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» Power-aware Test Scheduling Framework for IEEE 1687 Multi-Power Domain Networks using Formal Techniques
[Link to the Homepage of this journal]
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Author:
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Payam Habiby, Sebastian Huhn, Rolf Drechsler |
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Microelectronics Reliability |
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accepted, pp. 1-11 |
Year:
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2022
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CONFERENCES |
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» Optimization-based Test Scheduling for IEEE 1687 Multi-Power Domain Networks Using Boolean Satisfiability
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Author:
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Payam Habiby, Sebastian Huhn, Rolf Drechsler
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28th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) |
Reference:
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| Apulia, Italy, 2021
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| [To the Site of this Conference]
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» Power-aware Test Scheduling for IEEE 1687 Networks with Multiple Power Domains
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Author:
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Payam Habiby, Sebastian Huhn, Rolf Drechsler |
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33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
Reference:
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| Frascati (Rome), Italy, 2020
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| [To the Site of this Conference]
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WORKSHOPS |
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» An ILP-based Global Optimum Test Scheduler for IEEE 1687 Multi-Power Domain Networks
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Author:
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Payam Habiby, Sebastian Huhn and Rolf Drechsler
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34. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ) |
Reference:
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| Bremerhaven, Germany, 2022
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| [Link to the Workshop]
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» Test Scheduling Optimization Model for IEEE 1687 Multi-Power Domain Networks Using Boolean Satisfiability
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Author:
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Payam Habiby, Sebastian Huhn and Rolf Drechsler
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33. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ) |
Reference:
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| Nordhausen, Germany, 2021
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| [view Pdf]
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| [Link to the Workshop]
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