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Universität Bremen Universität Bremen Fachbereich 3 Informatik
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Debug Automation from Pre-Silicon to Post-Silicon

» Debug Automation from Pre-Silicon to Post-Silicon


Verlag:


Springer
Autor:

Mehdi Dehbashi, Görschwin Fey
Format:
eBook, Hardcover
Erscheinungsjahr:


2015

Hyperlink:

Klick hier


Beschreibung:
This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.





English









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