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» Model-Based Diagnosis versus Error Explanation




Autor:

Heinz Riener, Görschwin Fey
Konferenz:
10th ACM/IEEE International Conference on Formal Methods and Models for Codesign (MEMOCODE'12)
Referenz:

Arlington, Virginia. USA, 2012
Hyperlink:

[Link zur Konferenz]



» Circuit Line Minimization in the HDL-based Synthesis of Reversible Logic




Autor:

Robert Wille, Mathias Soeken, Eleonora Schönborn, Rolf Drechsler
Konferenz:
IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
Referenz:

Amherst, USA, 2012
Hyperlink:

[Link zur Konferenz]



» On Modeling and Evaluation of Logic Circuits Under Timing Variations




Autor:

Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan
Konferenz:
15th Euromicro Conference on Digital System Design (DSD)
Referenz:

Izmir, Turkey, 2012
Hyperlink:

[Link zur Konferenz]



» Coverage-driven Stimuli Generation




Autor:

Shuo Yang, Robert Wille, Daniel Große, Rolf Drechsler
Konferenz:
15th Euromicro Conference on Digital System Design (DSD)
Referenz:

Izmir, Turkey, 2012
Hyperlink:

[Link zur Konferenz]



» Reversible Circuits: Recent Accomplishments and Future Challenges for an Emerging Technology




Autor:

Rolf Drechsler, Robert Wille
Konferenz:
International Symposium on VLSI Design and Test (VDAT)
Referenz:

Shibpur, India, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» Assisted Behavior Driven Development Using Natural Language Processing




Autor:

Mathias Soeken, Robert Wille, Rolf Drechsler
Konferenz:
50th International Conference on Objects, Models, Components, Patterns (TOOLS)
Referenz:

Prague, Czech Republic, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» A New SAT-based ATPG for Generating Highly Compacted Test Sets




Autor:

Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
Konferenz:
15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Referenz:

Tallinn, Estonia, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» Automated Debugging from Pre-Silicon to Post-Silicon




Autor:

Mehdi Dehbashi, Görschwin Fey
Konferenz:
15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Referenz:

Tallinn, Estonia, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» Automated Feature Localization for Hardware Designs using Coverage Metrics




Autor:

Jan Malburg, Alexander Finder, Görschwin Fey
Konferenz:
Design Automation Conference (DAC)
Referenz:

San Francisco, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» Realizing Reversible Circuits Using a New Class of Quantum Gates




Autor:

Zahra Sasanian, Robert Wille, Michael Miller
Konferenz:
Design Automation Conference (DAC)
Referenz:

San Francisco, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» Functional Analysis of Circuits Under Timing Variations




Autor:

Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan
Konferenz:
17th IEEE European Test Symposium (ETS)
Referenz:

Annecy, France, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» Optimizing the Mapping of Reversible Circuits to Four-Valued Quantum Gate Circuits




Autor:

Mathias Soeken, Zahra Sasanian, Robert Wille, D. Michael Miller, Rolf Drechsler
Konferenz:
42nd International Symposium on Multiple-Valued Logic (ISMVL)
Referenz:

2012, Victoria
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» A Synthesis Flow for Sequential Reversible Circuits




Autor:

Mathias Soeken, Robert Wille, Christian Otterstedt, Rolf Drechsler
Konferenz:
42nd International Symposium on Multiple-Valued Logic (ISMVL)
Referenz:

2012, Victoria
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» Exact Synthesis of Toffoli Gate Circuits with Negative Control Lines




Autor:

Robert Wille, Mathias Soeken, Nils Przigoda, Rolf Drechsler
Konferenz:
42nd International Symposium on Multiple-Valued Logic (ISMVL)
Referenz:

Victoria, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» Automatic Design of Low-Power Encoders Using Reversible Circuit Synthesis




Autor:

Robert Wille, Rolf Drechsler, Christof Oswald, Alberto Garcia-Ortiz
Konferenz:
Design, Automation and Test in Europe (DATE)
Referenz:

Dresden, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» A Guiding Coverage Metric for Formal Verification




Autor:

Finn Haedicke, Daniel Große, Rolf Drechsler
Konferenz:
Design, Automation and Test in Europe (DATE)
Referenz:

Dresden, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» Eliminating Invariants in UML/OCL Models




Autor:

Mathias Soeken, Robert Wille, Rolf Drechsler
Konferenz:
Design, Automation and Test in Europe (DATE)
Referenz:

pp. 1142-1145, Dresden, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» Debugging of Inconsistent UML/OCL Models




Autor:

Robert Wille, Mathias Soeken, Rolf Drechsler
Konferenz:
Design, Automation and Test in Europe (DATE)
Referenz:

pp. 1078-1083, Dresden, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» Synthesis of Reversible Circuits with Minimal Lines for Large Functions




Autor:

Mathias Soeken, Robert Wille, Christoph Hilken, Nils Przigoda, Rolf Drechsler
Konferenz:
Asia and South Pacific Design Automation Conference (ASP-DAC)
Referenz:

pp. 85-92, Sydney, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]



» Improved Fault Diagnosis for Reversible Circuits




Autor:

Hongyan Zhang, Robert Wille, Rolf Drechsler
Konferenz:
Asian Test Symposium (ATS)
Referenz:

New Delhi, 2011
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]




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