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Home « Team « Publikationen
» Publikationen von
Hongyan Zhang
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BÜCHER |
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BUCHBEITRÄGE |
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ZEITSCHRIFTEN |
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KONFERENZEN |
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» Fault Ordering for Automatic Test Pattern Generation of Reversible Circuits
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Autor:
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Robert Wille, Hongyan Zhang, Rolf Drechsler |
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43rd International Symposium on Multiple-Valued Logic (ISMVL) |
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| Toyama, 2013
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| [Link zur Konferenz]
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| [hier ansehen]
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» Improved Fault Diagnosis for Reversible Circuits
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Autor:
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Hongyan Zhang, Robert Wille, Rolf Drechsler |
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Asian Test Symposium (ATS) |
Referenz:
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| New Delhi, 2011
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| [Link zur Konferenz]
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| [hier ansehen]
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» Determining Minimal Testsets for Reversible Circuits Using Boolean Satisfiability
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Autor:
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Hongyan Zhang, Stefan Frehse, Robert Wille, Rolf Drechsler |
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10th IEEE Africon |
Referenz:
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| Livingstone, 2011
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| [Link zur Konferenz]
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» ATPG for Reversible Circuits Using Simulation,
Boolean Satisfiability, and Pseudo Boolean
Optimization
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Autor:
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Robert Wille, Hongyan Zhang, Rolf Drechsler |
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IEEE Computer Society Annual Symposium on VLSI (ISVLSI) |
Referenz:
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| pp. 120-125, Chennai, 2011
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| [Link zur Konferenz]
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| [hier ansehen]
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WORKSHOPS |
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» SAT-based ATPG for Reversible Circuits
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Autor:
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Hongyan Zhang, Robert Wille, Rolf Drechsler |
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5th International Design & Test Workshop (IDT) |
Referenz:
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| pp. 149-154, Abu Dhabi, 2010
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| [Link zum Workshop]
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