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» Publikationen von Jan Malburg


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BUCHBEITRÄGE


ZEITSCHRIFTEN

» Debugging hardware designs using dynamic dependency graphs
[Link zur Zeitschriften-Homepage]




Autor:

Jan Malburg, Alexander Finder, Görschwin Fey
Zeitschrift:
Microprocessors and Microsystems (MICPRO)
Details:
accepted, DOI: 10.1016/j.micpro.2016.10.004 Link
Jahr:


2016




» A Simulation Based Approach for Automated Feature Localization
[Link zur Zeitschriften-Homepage]




Autor:

Jan Malburg, Alexander Finder, Görschwin Fey
Zeitschrift:
IEEE Trans. on CAD of Integrated Circuits and Systems
Details:
Volume:33, Issue: 12, Pages 1886-1899 DOI: 10.1109/TCAD.2014.2360462 Link
Jahr:


2014




» Search-based testing using constraint-based mutation
[Link zur Zeitschriften-Homepage]




Autor:

Jan Malburg, Gordon Fraser
Zeitschrift:
Software Testing, Verification and Reliability
Details:
Volume 24, Issue 6, pages 472–495, September 2014, DOI: 10.1002/stvr.1508 Link
Jahr:


2013 (online)





KONFERENZEN


» Towards Making Fault Injection on Abstract Models a More Accurate Tool for Predicting RT-Level Effects




Autor:

Tino Flenker, Jan Malburg, Goerschwin Fey, Serhiy Avramenko, Massimo Violante and Matteo Sonza Reorda
Konferenz:
IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
Referenz:

Bochum, Germany, 2017
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]


» Property mining using dynamic dependency graphs




Autor:

Jan Malburg, Tino Flenker, Goerschwin Fey
Konferenz:
22nd Asia and South Pacific Design Automation Conference (ASP-DAC)
Referenz:

Chiba/Tokyo, Japan, 2017
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]


» Designing Reliable Cyber-Physical Systems




Autor:

Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon Ter Braak, Sergei Devadze, Görschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard Rauwerda, Heinz Riener, Franz Röck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao
Konferenz:
Forum on specification & Design Languages (FDL)
Referenz:

Bremen, Germany, 2016
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]


» Automatically Connecting Hardware Blocks via Light-Weight Matching Techniques




Autor:

Jan Malburg Niklas Krafczyk Görschwin Fey
Konferenz:
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Referenz:

pp. 21-26, Warschau, Polen, 2014
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]


» Analyse dynamischer Abhängigkeitsgraphen zum Debugging von Hardwaredesigns




Autor:

Jan Malburg Alexander Finder Görschwin Fey
Konferenz:
7. ITG/GMM/GI-Fachtagung Zuverlässigkeit und Entwurf (ZuE2013)
Referenz:

pp. 59-66, Dresden, Germany, 2013
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]


» Tuning Dynamic Data Flow Analysis to Support Design Understanding




Autor:

Jan Malburg, Alexander Finder, Görschwin Fey
Konferenz:
Design, Automation and Test in Europe (DATE'13)
Referenz:

pp. 1179-1184, Grenoble, France, 2013
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]


» Automated Feature Localization for Hardware Designs using Coverage Metrics




Autor:

Jan Malburg, Alexander Finder, Görschwin Fey
Konferenz:
Design Automation Conference (DAC)
Referenz:

pp. 941-946, San Francisco, 2012
Hyperlink:

[Link zur Konferenz]
PDF:

[hier ansehen]


WORKSHOPS


» Mining Latency Guarantees for RT-level Designs




Autor:

Jan Malburg, Heinz Riener, Görschwin Fey
Workshop:
4th Workshop on Design Automation for Understanding Hardware Designs (DUHDe)
Referenz:

Lausanne, Switzerland, 2017
Hyperlink:

[Link zum Workshop]


» Generating good properties from a small number of use cases




Autor:

Jan Malburg, Tino Flenker, Görschwin Fey
Workshop:
International Verification and Security Workshop (IVSW'16)
Referenz:

Sant Feliu de Guixols, Catalunya, Spain, 2016
Hyperlink:

[Link zum Workshop]


» Towards analysing feature locations through testing traces with BUT4Reuse




Autor:

Jabier Martinez, Jan Malburg, Tewfik Ziadi, Görschwin Fey
Workshop:
DATE Friday Workshop: Design Automation for Understanding Hardware Designs (DUHDe)
Referenz:

Grenoble, France, 2015
Hyperlink:

[Link zum Workshop]


» Mutation based Feature Localization




Autor:

Jan Malburg, Emmanuelle Encrenaz-Tiphene, Görschwin Fey
Workshop:
15th International Workshop on Microprocessor Test and Verification
Referenz:

Austin, USA, 2014
PDF:

[hier ansehen]
Hyperlink:

[Link zum Workshop]


» Automatically Connecting Hardware Blocks via Light-Weight Matching Techniques (Extended Abstract)




Autor:

Jan Malburg, Niklas Krafczyk, Görschwin Fey
Workshop:
DATE Friday Workshop: Design Automation for Understanding Hardware Designs
Referenz:

page 30, Dresden, Germany, 2014
PDF:

[hier ansehen]
Hyperlink:

[Link zum Workshop]


» Mutation based Feature Localization




Autor:

Jan Malburg, Emmanuelle Encrenaz-Tiphene, Görschwin Fey
Workshop:
DATE Friday Workshop: Design Automation for Understanding Hardware Designs
Referenz:

pp. 55-60, Dresden, Germany, 2014
Hyperlink:

[Link zum Workshop]


» Automated Feature Localization for Hardware Designs using Coverage Metrics




Autor:

Jan Malburg, Alexander Finder, Görschwin Fey
Workshop:
15. Workshop Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV)
Referenz:

pp. 85-96, Kaiserslautern, Germany, 2012
PDF:

[hier ansehen]
Hyperlink:

[Link zum Workshop]

















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