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Home « Team « Publikationen
» Publikationen von
Mehdi Dehbashi
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BÜCHER |
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BUCHBEITRÄGE |
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ZEITSCHRIFTEN |
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» Debug Automation for Logic Circuits Under Timing Variations
[Link zur Zeitschriften-Homepage]
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Autor:
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Mehdi Dehbashi, Görschwin Fey |
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IEEE Design & Test of Computers |
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accepted |
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2013
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» Automated Design Debugging in a Testbench-Based Verification Environment
[Link zur Zeitschriften-Homepage]
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Autor:
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Mehdi Dehbashi, André Sülflow, Görschwin Fey |
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Embedded Hardware Design - Microprocessors and Microsystems (MICPRO) |
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Volume 37, Issue 2, pp. 206-217 |
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2013
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KONFERENZEN |
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» Efficient Automated Speedpath Debugging
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Autor:
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Mehdi Dehbashi, Görschwin Fey |
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16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) |
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| pp. 48-53, Karlovy Vary, Czech Republic, 2013
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| [Link zur Konferenz]
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| [hier ansehen]
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» Automated Post-Silicon Debugging of Failing
Speedpaths
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Autor:
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Mehdi Dehbashi, Görschwin Fey |
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21st IEEE Asian Test Symposium (ATS) |
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| pp. 13-18, Niigata, Japan, 2012
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| [Link zur Konferenz]
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| [hier ansehen]
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» Application of Timing Variation Modeling to Speedpath Diagnosis
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Autor:
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Mehdi Dehbashi, Görschwin Fey |
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4th International Conference on System, Software, SoC and Silicon Debug (S4D) |
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| pp. 34-37, Vienna, Austria, 2012
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| [Link zur Konferenz]
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| [hier ansehen]
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» On Modeling and Evaluation of Logic Circuits
Under Timing Variations
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Autor:
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Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan |
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15th Euromicro Conference on Digital System Design (DSD) |
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| pp. 431-436, Izmir, Turkey, 2012
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| [Link zur Konferenz]
| PDF:
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| [hier ansehen]
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» Automated Debugging from Pre-Silicon to Post-Silicon
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Autor:
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Mehdi Dehbashi, Görschwin Fey |
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15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) |
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| pp. 324-329, Tallinn, Estonia, 2012
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| [Link zur Konferenz]
| PDF:
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| [hier ansehen]
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» Functional Analysis of Circuits Under Timing
Variations
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Autor:
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Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan
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17th IEEE European Test Symposium (ETS) |
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| pp. 177, Annecy, France, 2012
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| [Link zur Konferenz]
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| [hier ansehen]
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» Automated Post-Silicon Debugging of Design Bugs
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Autor:
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Mehdi Dehbashi, Görschwin Fey |
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3rd International Conference on System, Software, SoC and Silicon Debug (S4D) |
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| pp. 67-71, Munich, Germany, 2011
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| [Link zur Konferenz]
| PDF:
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| [hier ansehen]
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» Automated Design Debugging in a Testbench-Based Verification Environment
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Autor:
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Mehdi Dehbashi, André Sülflow, Görschwin Fey |
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14th Euromicro Conference on Digital System Design (DSD) |
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| pp. 479-486, Oulu, Finland, 2011
Best Paper Candidate
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| [Link zur Konferenz]
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| [hier ansehen]
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» Fault Effects in FlexRay-Based Networks with Hybrid Topology
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Autor:
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Mehdi Dehbashi, Vahid Lari, Seyed Ghassem Miremadi, Mohammad Shokrollah-Shirazi |
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3rd IEEE International Conference on Availability, Reliability and Security (ARES) |
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| pp. 491-496, Barcelona, Spain, 2008
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| [Link zur Konferenz]
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| [hier ansehen]
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» Evaluation of Babbling Idiot Failures in FlexRay-Based Networks
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Autor:
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Vahid Lari, Mehdi Dehbashi, Seyed Ghassem Miremadi, Mojtaba Amiri |
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7th IFAC International Conference on Fieldbuses and Networks in Industrial and Embedded Systems (FET) |
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| pp. 399-406, Toulouse, France, 2007
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| [Link zur Konferenz]
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| [hier ansehen]
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» Assessment of Message Missing Failures in FlexRay-Based Networks
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Autor:
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Vahid Lari, Mehdi Dehbashi, Seyed Ghassem Miremadi, Navid Farazmand |
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13th IEEE/IFIP Pacific Rim International Symposium on Dependable Computing (PRDC) |
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| pp. 191-194, Melbourne, Australia, 2007
| Hyperlink:
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| [Link zur Konferenz]
| PDF:
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| [hier ansehen]
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WORKSHOPS |
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» Towards Debug Automation for Timing Bugs at RTL
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Autor:
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Mehdi Dehbashi, Görschwin Fey |
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25. GI/GMM/ITG Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ) |
Referenz:
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| Dresden, Germany, 2013
| PDF:
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| [hier ansehen]
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| [Link zum Workshop]
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» Functional Analysis of Circuits Under Timing
Variations
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Autor:
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Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan |
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edaWorkshop |
Referenz:
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| Hannover, Germany, 2012
| PDF:
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| [hier ansehen]
| Hyperlink:
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| [Link zum Workshop]
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» Automated Debugging from Pre-Silicon to Post-Silicon
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Autor:
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Mehdi Dehbashi, Görschwin Fey |
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24. GI/GMM/ITG Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
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Referenz:
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| Cottbus, Germany, 2012
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| [Link zum Workshop]
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