Vortragende(r): Indranil Sen Gupta
(Indian Institute of Technology Kharagpur, India)
Fault diagnosis plays a very important role in enhancing the yield of the VLSI manufacturing process. A number of researchers have proposed various techniques for fault diagnosis over the years, but a number of practical problems still remain. In particular, the problem of multiple fault diagnosis and characterization of test sets from the point of view of diagnosis did not receive much attention. The first part of the talk will discuss a framework to analyze multiple faults, and diagnose the same. Based on multiple fault simulation in a particle swarm optimization environment, experimentation on benchmarks reveal that up to ten faults can be diagnosed within a reasonable amount of time. The second part of the talk will discuss a new metric to characterize test sets based on their diagnostic power. The metric can also be utilized to increase the diagnosability of incompletely specified test sets using don't care filling. The don't care filling approach can be integrated with test pattern generation tools to aid in better diagnostic pattern set generation.
Prof. Indranil Sen Gupta has obtained his B.Tech., M.Tech. and Ph.D. degrees in Computer Science and Engineering from the University of Calcutta, India in the years 1983, 1985 and 1990, respectively. Currently, he is a full professor in the Department of Computer Science and Engineering at the Indian Institute of Technology as well as the Managing Director of the Science and Technology Entrepreneur's Park (STEP) in Kharagpur, India. He has over 25 years of teaching and research experience, guided 13 PhD students (with 8 more ongoing), and has more than 130 publications to his credit in international journals and conferences. His research interests include VLSI design and testing, cryptography and network security, as well as reversible computing.