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Contents  
  • Identification
  • Author(s)
  • Congress/Conference/Publication
  • Related publications
  • Identification

    /Blanco, 2001/
    SPI Patterns: Learning from Experience

    Author(s)

    Marina Blanco
    Pedro Gutiérrez
    Giuseppe Satriani

    Congress/Conference/Publication

    IEEE Software, Vol 18 number3, May/June 2001. Pages 28-35. Download for IEEE subscribers: http://dlib.computer.org/so/books/so2001/pdf/s3028.pdf

    Related publications

    General topics on process technologies: Process Improvement

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