| 08:00-09:30 |
Lecture 4: Manufacturing Test of Secure Devices: Threats Introduced by Test Infrastructures [G. Di Natale] |
| 09:30-09:45 |
Break: Coffee and Checkout |
| 09:45-11:00 |
Lecture 4: Manufacturing Test of Secure Devices: Threats Introduced by Test Infrastructures [G. Di Natale] |
| 11:00-11:45 |
Break: Lunch |
| 11:45 |
Bus departure to visit Windmill Oberneuland |
| 13:15 |
Bus departure to Swissôtel Bremen |
| 14:00-16:00 |
Lecture 5: Automotive Test for Functional Safety [Y. Zorian] |
| 14:00-16:00 |
Lecture 6: Embedded System Security: Cryptographic Challenges and Physical Threats [T. Güneysu] |
| 16:00-16:30 |
Break: Coffee |
| 16:30-18:30 |
Lecture 5: Automotive Test for Functional Safety [Y. Zorian] |
| 16:30-18:30 |
Lecture 6: Embedded System Security: Cryptographic Challenges and Physical Threats [T. Güneysu] |