23rd IEEE European Test Symposium | May 28- June 01, 2018 | Bremen, Germany
The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, applications,
hot topics, and new trends in the area of electronic-based circuit and system testing and reliability. In 2018, ETS will take place at Swissôtel, Bremen, Germany.
It is organized by the University of Bremen, which co-sponsors the event jointly with the IEEE Council on Electronic Design Automation (CEDA). ETS traditionally
enjoys a strong balance among academic and industrial participants. In addition to regular Scientific Papers, Special Sessions, Panels, and Embedded Tutorials,
ETS features Vendor Sessions and Table-Top Demos as well as a special track on Emerging Test Strategies (ETS2) where new issues are presented by the industry and
are discussed in an informal atmosphere. ETS is the major event of the European Test Week, which includes TSS (Test Spring School) and fringe workshops.
You are invited to participate and submit your contributions to ETS’18. The following topic chairs have been selected to put particular emphasis on their topic:
P. Bernardi: Microprocessor and On-line Test, K. Chakrabarty: Emerging Technologies in Test, P. Girard: Power Issues in Test, S. Hamdioui: Memory and Nanotechnology Test, E.
Larsson: Test Architectures and Standards, G. Léger: Analog/Mixed Signal Test, M. Maniatakos: Security and Trust Issues in Test, I. Polian: Test Generation and Reliability,
J. Rivoir: Automatic Test Equipment and Yield, C. Scholl: Validation and Verification, A. Singh: Defect-based Test and Variability.
More Information coming soon....
Submission of title, abstract, authors:
December 4, 2017 Notification of acceptance:
February 13, 2018 Camera-ready manuscript:
March 18, 2018 Download Call for Papers